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Component Test

A combination of two or more interrelated equipment (sets) arranged in a functional package to perform testing of particular components. (atis.org)


Showing results: 571 - 585 of 866 items found.

  • EMC Tests

    7Layers, Inc.

    Electromagnetic compatibility (EMC) must be demonstrated for all devices with integrated radio components for approval in almost every country in the world. EMC tests examine whether the electromagnetic emissions from your product are within the specified limits and whether your product and its functionalities themselves are not negatively influenced by electromagnetic emissions. We offer EMC tests for modules and end products with integrated radio technology as well as IT and IoT products. Our accredited EMC test laboratories are equipped to test almost all modern radio technologies, and our EMC experts have many years of experience in this area. With us, your modern radio products are on the safe path to the global market.

  • Waterproof Test Chamber

    JL-XC - Lisun Electronics Inc.

    JL-XC series waterproof test chamber is mainly used for small electronic and electrical products. Such as lamps, electrical cabinets, electrical components and so one. The products are tested for physical and other related properties under simulated climatic conditions. After the test, it is judged whether the performance of the product meets the requirements by verification, so as to be used in the design, improvement, verification and factory inspection of the product. Comply with IEC60529:2001 《Degrees of protection provided by enclosures (IP Code)》, GB4208-2008 《Shell Protection Grade (IP Code)》 14.2.8 Terms and GB7000.1 《Lamps Part 1: General Requirements and Tests》 9.2.9 Terms.

  • Automated Production Testing

    Crystal instruments

    Automated production testing is critical in today’s competitive manufacturing environment. Companies can no longer rely on variable costs, non-uniformity, and potential health hazards that come with a laborer-based manufacturing line. This is no less true for sound and vibration tests, ranging from in-process burn-in tests to product validation and verification tests. The measurement tools and intelligence behind present day manufacturing include data acquisition equipment as well as closed-loop control. And while these systems may not take part in the assembly of any goods, they are just as important to ensure quality control for both components coming into an assembly line and products going out.

  • Digital LOOP/PSC/LOAD Tester

    2811 LP - Standard Electric Works Co., Ltd

    ● Microprocessor-controlled.● Displays and sound warning if external voltage present.● Displays mains voltage, scroll trough menus.● Checks wiring integrity (LEDs and display).● Single button operation.● Auto-off/auto-ranging.● Combined prospective short circuit current, PSC and LOOP tester.● Built-in carry case, test leads in separate pouch.● Loop test for L-E and L-N and PSC.● Voltage test L-N and L-E.● Enables analysis of constituent components in L-E and L-N loops giving resistance of earth, neutral wire, live wire and transformer winding.● Display can be customized for special orders.● 60Hz available on request.

  • Adjustable Press Plate Bed of Nails Testers

    Protector Adjustable Family - Test Electronics

    Designed for testing heavy massive boards. Boards with heavy components like large transformers and inductors can destroy normal test fixtures. This design utilizes a 3 plate system where an internal lever actuated sub plate containing the test pins raises to probe the circuit board when the handle is pulled. Heavy boards can bend and break exposed test pins. Similarly large boards which need to be probed by very small delicate test pins can also benefit from this protected test fixture design. This fixture is recommended in situations where there is a high board mass to pin size ratio and pin protection is required. Front and rear panel modular inserts allow for easy updates and customizations to the user hardware interface.

  • Press Down Rods Bed of Nails Testers

    Protector Press Rods Family - Test Electronics

    Designed for testing heavy massive boards. Boards with heavy components like large transformers and inductors can destroy normal test fixtures. This design utilizes a 3 plate system where an internal lever actuated sub plate containing the test pins raises to probe the circuit board when the handle is pulled. Heavy boards can bend and break exposed test pins. Similarly large boards which need to be probed by very small delicate test pins can also benefit from this protected test fixture design. This fixture is recommended in situations where there is a high board mass to pin size ratio and pin protection is required. Front and rear panel modular inserts allow for easy updates and customizations to the user hardware interface.

  • Signal Chain µModule Receivers

    µModule® - Analog Devices Inc.

    Analog Devices µModule® (micromodule) receivers consist of high performance, high speed ADCs with fixed-gain, high speed amplifiers and antialias filters. Our integrated ADC and driver products include integrated bypass capacitance and simplify the high frequency layout required to preserve ac performance. The board space savings are significant for instrumentation applications such as spectrum analyzers, oscilloscopes ,and communications test equipment, or for communications applications such as high sensitivity receivers, software-defined radio (SDR), or signal intelligence receivers. Our portfolio uses system-in-package (SiP) technology similar to multichip modules (MCM) to integrate components with different technologies, along with passive components to make an integrated subsystem.

  • Gen-Z

    Teledyne LeCroy

    Gen-Z is a data-access technology designed to provide high-speed, low-latency, memory-semantic access to data and devices via direct-attached, switched or fabric topologies. Gen-Z components use low-latency read and write operations to directly access data and use a variety of advanced operations to move data with minimal application or processor involvement. Gen-Z fabric utilizes memory-semantic communications to move data between memories on different components with minimal overhead. Memory-semantic communications are extremely efficient and simple, which is critical to delivering optimal performance and power consumption. Teledyne LeCroy provides protocol analysis and error injection test equipment to support development and debug of Gen-Z based devices

  • Integrated Function Tester for Inductance Ballast

    UI2001B - Lisun Electronics Inc.

    • Measure input parameters: Vrms, lrms, W, PF, Hz, current crest factor, total harmonic and 0~50th harmonic components. V range: 10.0~300.0V, A range: 0.010~2.000A, F range: 45~65Hz • Measure output parameters: Vrms, lrms, W, PF, Hz, current crest factor, total harmonic and 0~50th harmonic components Lamp voltage range: 10.0~450.0V, Lamp current range: 0.010~2.000A • Accuracy: ± (0.4% reading+0.1% range+1 digit) • Can test every kind of curve, print both data & curve • Communication interface available for PC, running under Windows98/2000/XP/Vista

  • HV DC Voltage Generators

    Fivestar HV Testing Equipment Co., Ltd.

    HV DC voltage generators are used to generate high voltage DC test voltages for routine, type and development test on components and complete systems found in electrical power supply systems and operating on DC voltage (HV transmission systems etc). There are K and M series, and available for indoor and outdoor.

  • System Level Test and Burn-in Solutions

    Aehr Test Systems

    System Level Test (SLT) is a paradigm shift from traditional structural and functional testing. The device is tested in a complete, integrated system to evaluate its compliance against specified requirements. The system approach allows for higher and more cost-effective test coverage especially for multi-function and non-deterministic devices. It also brings new integration and test challenges like: ..Designing test fixtures on Burn-in Boards with system components ...

  • Hydraulics Testing

    National Technical Systems

    Fluid power systems play a critical role in many industries, and are one of the three major forms of power transmission along with electrical and mechanical power systems. In many cases, however, mechanical and electrical methods cannot provide a practical power transmission solution. In these cases, fluid power (whether hydraulic or pneumatic) is often used because it can deliver linear and rotary motion with high force and torque within a smaller, lighter package than is possible with other forms of power transmission. Some of the most common applications of hydraulic systems are in heavy construction and off-highway equipment. Other applications can be seen in aircraft, mass transportation systems (such as trains), construction, mining, agriculture, waste reduction, and utility equipment. The various components (such as valves, actuators, cylinders, accumulators, etc.) that make up these systems must perform reliably and have a reasonable life span. Only a thorough test program carried out under simulated field use conditions can insure that any component part or assembly will meet its original design goals for performance, reliability and longevity. Many internationally recognized organizations have published test standards that apply to hydraulic/pneumatic and fluid power systems and components. Some of these organizations are:

  • Plugbord

    3682 - VECTOR Electronics and Technology, Inc.

    44 Gold plated edge contacts (22 each side)on 0.156"(3.96mm) centers.​Interleaved buses pattern on wiring side only solder- coated for user convenience. Bus outline silkscreened on component side to facilitatecomponent placement. Mounts DIPs with 0.3”, 0.4” & 0.9” lead spacing. Unclad test point area at top of board Row and column legends provided

  • Plugbord

    3682-2 - VECTOR Electronics and Technology, Inc.

    44 Gold plated edge contacts (22 each side)on 0.156"(3.96mm) centers.​Interleaved buses pattern on wiring side only solder- coated for user convenience.Bus outline silkscreened on component side to facilitatecomponent placement. Mounts DIPs with 0.3”, 0.4” & 0.9” lead spacing. Unclad test point area at top of board Row and column legends provided

  • Universal SOIC ZIF (Zero-Insertion-Force) Test Socket

    Series 547 - Aries

    Universal SOIC Zero Insertion Force Test Socket. Devices with up to 44 pins can be inserted without bending or otherwise damaging the legs, since no force is required to either insert or remove the component from the socket. Accepts SOIC gull-wing and J-lead devices, up to 44 pins on .050 [1.27] lead pitch, body widths from .150 to .600 [3.81 to 15.24].

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